2009 M&M

POSTER AND ORALS

Poster Number: 2
Title: Localized Accumulation of Silicon (Si) in Grape Leaves Affected by Pierce’s Disease
Authors:  B Leite; Thermo Fisher Scientific, WI; P Andersen; University of Florida, FL
Date/Time: Monday, July 27, 2009, 3:30 PM
Room: Exhibit Hall

Poster Number: 73
Title: XPS and SEM/STEM Characterization of Silver Nanoparticles Formed from the X-ray-Induced and Thermal Reduction of Silver Behenate
Authors:  BR Strohmeier, KL Bunker, CL Lopano, JP Marquis, JD Piasecki, KE Bennethum; RJ Lee Group, Inc; RG White, T Nunney; Thermo Fisher Scientific; RJ Lee; RJ Lee Group, Inc
Date/Time: Monday, July 27, 2009, 3:30 PM
Room: Exhibit Hall

Oral Presentation Number: 239
Title: A New Wavelength Spectrometer for SEM Analysts
Authors:  P Camus; Thermo Fisher Scientific
Date/Time: Tuesday, July 28, 2009, 2:00 PM
Room: B15C

Oral Presentation Number: 405
Title: Quantitative Characterisation of Surface and Interface Chemistry with X-ray Photoelectron Spectroscopy (XPS)
Authors: TS Nunney, O Mustonen, RG White; Thermo Fisher Scientific, United Kingdom
Date/Time: Wednesday, July 29, 2009, 11:15 AM
Room: E11C
 
Oral Presentation Number: 499
Title: Elevation Resolved Elemental Mapping with SEM/EDS
Authors: J Konopka; Thermo Fisher Scientific; M Betts; Hitachi High Technologies America Inc
Date/Time: Wednesday, July 29, 2009, 3:00 PM
Room: B15A
 
Oral Presentation Number: 665
Title: How Much EDS Resolution Do I Need?
Authors: NA Bulloss; Thermo Fisher Scientific
Date/Time: Thursday 11:30 AM
Room: B15A

EXHIBITOR TUITORIALS - Pre-registration is Closed.  Please Register On-site!

COMPASS and Direct-to-Phase: Beyond Traditional Element Mapping
Time: Monday Vendor tutorial
Nick Bulloss
Thermo Fisher Scientific, 5225 Verona Rd, Madison, WI 53711

Spectral imaging EDS data contains a wealth of information about the elemental distributions within the analyzed sample. Many data sets contain so much information that EDS expert analysis is required to extract and interpret the results. Even under these circumstances, some information might be missed and interpretation may vary between analysts. A more robust method of data mining is required for complete and accurate interpretation.

Multivariate statistical analysis (MSA) is a method that analyzes the whole spectral imaging data set with no user input or bias. The COMPASS and Direct-to–Phase programs achieve rigorous statistical chemical phase analysis concurrent with data acquisition. Live demonstrations will be given on real world (and difficult) samples.

MagnaRay: A Wavelength Spectrometer for SEM Analysts
Time: Tuesday Vendor tutorial
P. P. Camus
Thermo Fisher Scientific, 5225 Verona Road, Madison, WI 53711 USA

Wavelength Dispersive Spectroscopy (WDS) is a very powerful technique for many analyses using electron beam instruments. In the past, WDS has required operation by an expert user for optimum performance. The latest generation of WDS spectrometers was designed to relax that requirement for typical SEM operators and to operate at higher speeds to provide enhanced capabilities not available in previous products. These capabilities increase both the confidence of the analyst in results and the efficiency of the analyst to produce reports.

The Thermo Scientific MagnaRay WDS spectrometer will be demonstrated emphasizing the ease of operation for operators of all experience levels, and the traditional and new analytical capabilities of automatic WDS peak identification validation, energy scans, linescans and mapping, and quantitative analysis on an SEM.

K-Alpha: Rapid Surface Analysis for the Microscientist
Time: Tuesday vendor tutorial
Tim Nunney
Thermo Fisher Scientific, The Birches, Imberhorne Lane, East Grinstead, West Sussex RH19 1UB, UK

X-ray photoelectron spectroscopy (XPS) is a very powerful technique for materials analysis. The strength of the technique lies in its extremely high surface selectivity; elemental and chemical information is obtained from just the outer 10 nm of the sample. Historically, XPS instrumentation required expert-level operators and analysts, but new advances in instrument and software design have increased accessibility to surface analysis, promoting ease-of-use and rapid sample throughput.

The Thermo Scientific K-Alpha XPS system will be demonstrated during this tutorial, illustrating through a variety of applications problems (for example, insulators, feature analysis, chemical state imaging) how surface analysis can extend the information reach of the microscientist.

Introduction to Raman Microscopy
Time: Monday and Tuesday vendor tutorial
Dr. Mark H. Wall
Thermo Fisher Scientific, 5225 Verona Road, Madison, WI 53711 USA

Raman spectroscopy and Raman Microscopy in particular is a high information content technique that is complementary to SEM. Where as SEM provides valuable information about the elemental composition of a sample under investigation, Raman microscopy provides additional, valuable information (molecular compositional information and its spatial distribution).  This tutorial will cover the fundamentals of Raman spectroscopy, how it is applied to a variety of samples and the latest advances in instrumentation that has made Raman microscopy accessible to a larger number of researchers and analysts.

Pre-registration is Closed.  Please Register On-site!