We lead the industry in developing instruments that bring spectroscopic techniques to micron-sized features. EDS and WDS instruments enable new levels of materials characterization with X-ray microanalysis on electron microscopes, microbeam XRF systems characterization thin film stacks, and Raman microscopy brings molecular spectroscopy to micron-sized features.

Attend our XRF, OE and Automation seminar!

Taking place on July 16, 2009 in Cincinnati, Ohio/USA, this seminar offers access to information highlighting advanced and innovative approaches to solving problems with bulk elemental analysis, from research-oriented materials testing to high-throughput quality control testing and laboratory automation.

The NORAN System 7 X-ray Microanalysis system will change the way you use X-ray microanalysis. The system features the ability to process 1,000,000 x-rays per second and utilizes Direct-to-Phase software which simultaneously acquires and analyzes Spectral Imaging data. >>Read more

An Introduction to Modern Energy and Wavelength Dispersive Spectroscopies 

 

Dr Patrick Camus presents a review of modern EDS and WDS analysis. Recent developments in both hardware and software have increased both the data collection rate and the confidence in data interpretation to levels never before imagined. In the case of EDS, Direct-to-Phase analysis of Spectral Imaging mapping data permits the user to evaluate chemical phases during acquisition. Auto Peak Confirmation using WDS raises the confidence of the analyst in the peak labeling of spectra.

 

To listen to a recording of this webinar, click on the link below. 

EDS/WDS Webinar 

• X-Ray Microanalysis
• Microbeam XRF
• Surface Analysis
• Raman Microscopy
• Infrared Microscopy
• X-Ray Imaging/Sources
• CID Cameras & Imaging Technology