Our MicroXR microbeam XRF systemis the only XRF tool that enables you to measure the thickness quality of the complex metallic structures and can be finely tuned for each specific coating/deposition application produced in my fabrication line.
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Congratulations to Dr. Douglas Meier who won a Sapphire Blue Acer 10.1" Aspire One Notebook after registering to win with us at the 2009 Microscopy & Microanalysis Show in Richmond, VA.