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FT-IR Accessories

The real power and integration of Nicolet FT-IR spectrometers is evident when coupled with Thermo Fisher Scientific's line of Smart Accessories and Spectra-Tech accessories. Snap-in place functionality allows for immediate sampling. And, because Nicolet FT-IR accessories are pre-aligned, there is no need for adjustments. Smart Accessories are recognized by your Nicolet FT-IR bench, which can automatically optimize the system for the measurement technique that best suits the sample type or problem.


ATR is ideal for strongly absorbing or thick samples which often produce intense peaks when measured by infrared transmission. ATR works well for these samples because the intensity of the evanescent waves decays exponentially with distance from the surface of the ATR crystal, making the technique generally insensitive to sample thickness.

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Diffuse reflectance is commonly used for the analysis of both organic and inorganic samples that can be ground into a fine powder (less than 10 microns) and mixed in a powder matrix such as potassium bromide (KBr). It can also be used for the analysis of large intractable surfaces. Silicon carbide paper can be used to rub off a small amount of a variety of samples for analysis.

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A variety of FT-IR accessory modules are available for performing advanced spectroscopy analysis experiments and analyzing samples using hyphenated techniques such as GC-IR and TGA-IR.

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Specular reflectance is commonly used for the analysis of both organic and inorganic samples having large, flat, reflective surfaces. Reflection-absorption can occur when one of the above criteria is compromised and the sample has a reflective substrate present just below the surface. This type of analysis is commonly used for metallic surfaces, silicon wafers, thin films on reflective substrates, and laminated materials on metals.

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Transmission analysis involves passing energy through the sample and detecting that portion that is not absorbed or that is transmitted.

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