半导体计量

Training courses for Nicolet ECO FT-IR Metrology tools

- ECO 3500 FT-IR Metrology Tool

- Nicolet ECO 1000 FT-IR Metrology Tool

- Nicolet ECO 2000 FT-IR Metrology Tool

- Nicolet ECO/RS Wafer Profiling System

ICP-MS is the accepted and most powerful technique for the analysis and quantification of trace elements in both solid and liquid samples.  Its applications range from routine environmental analyses and geological applications, through to clinical research, material sciences and the semiconductor industry.

- ELEMENT2???ICP-MS

- XSeries II ICP-MS

- Nicolet Almega XR ??????????

- Nicolet Almega-Si Wafer Sampling Stage