Our MicroXR microbeam XRF systemis the only XRF tool that enables you to measure the thickness quality of the complex metallic structures and can be finely tuned for each specific coating/deposition application produced in my fabrication line.

Connect with Us Sweepstakes Winner

Congratulations to Dr. Douglas Meier who won a Sapphire Blue Acer 10.1" Aspire One Notebook after registering to win with us at the 2009 Microscopy & Microanalysis Show in Richmond, VA.

An Introduction to Modern Energy and Wavelength Dispersive Spectroscopies 

Dr Patrick Camus presents a review of modern EDS and WDS analysis. Recent developments in both hardware and software have increased both the data collection rate and the confidence in data interpretation to levels never before imagined. In the case of EDS, Direct-to-Phase analysis of Spectral Imaging mapping data permits the user to evaluate chemical phases during acquisition. Auto Peak Confirmation using WDS raises the confidence of the analyst in the peak labeling of spectra.

To listen to a recording of this webinar, click on the link below. 

EDS/WDS Webinar