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Microanalysis

Microbeam XRF

Our MicroXR microbeam XRF system is the only XRF tool that enables you to measure the thickness quality of the complex metallic structures and can be finely tuned for each specific coating/deposition application produced in my fabrication line.

Technical Note

COMPASS: More Accurate than Elemental Mapping
The COMPASS option on the NORAN System 7 automatically performs primary component analysis without user intervention. The user is confident that any conclusions drawn from the results are accurate.
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Industry Leader

We lead the industry in developing instruments that bring spectroscopic techniques to micron-sized features. EDS and WDS instruments enable new levels of materials characterization with X-ray microanalysis on electron microscopes, microbeam XRF systems characterization thin film stacks, and Raman microscopy brings molecular spectroscopy to micron-sized features.

NORAN System SIX

New Features

Changing the way you use X-ray microanalysis, the NORAN System SIX X-ray Microanalysis system now features Direct-to-Phase software which acquires and analyzes Spectral Imaging data simultaneously. Read more.

Application Note

Spatial Resolution in WDS Applications on FESEMs
Parallel Beam Spectrometry on a field emission microscope allows high spatial and peak resolution X-ray microanalysis for beam-sensitive or low-concentration samples, and samples with severe EDS peak overlaps. >>Download PDF