A unique design and multiple configurations makes these condensers affordable and flexible for your lab.

A unique design and multiple configurations make these objectives affordable and flexible for your lab.

The ATR objective permits non-destructive microscopic surface analyses of strong-IR absorbing materials, including organic and inorganic materials.

Centering targets for infrared microscopes

For use with Nicolet Centaurµs, Nic-Plan, IRµs and IR-Plan Advantage

Image contrast package using visible light

Multiple excitation wavelengths for sample observation with fluorescence.

Provides IR radiation at grazing incidence for analyzing thin coatings

Allows sample analysis over a temperature range of -196°C-600°C

Proven 3-CCD technology for video microscopy

Useful in the study of metal surfaces and molecular symmetry in single crystals

Extend the utility of IR microscopes for light microscopy and photomicrography

Facilitate sample positioning through different manual configurations

For flattening samples for transmission analysis

Peeling polymer layers for transmission analysis

Viewing options for Centaurµs/Continuµm scopes

Sample preparation tools for infrared microscopy.

Ideal for mapping or planned sampling sequences in infrared microscopy.

Unattended analysis of samples with many points

External reflectance and ATR measuring for samples too big for microscope stage

Analysis using transmission, reflection & micro ATR sampling capabilities

Corrects for spherical aberration caused by infrared windows beneath the sample

Corrects spherical aberration caused by infrared windows placed above samples



Improve visual contrast enhancement.