The new surface analysis instrument, Thermo Scientific K-Alpha is a fully integrated, monochromated small-spot X-ray Photoelectron Spectrometer (XPS) system.
Product Detail
XPS is already well-established in many branches of materials characterisation and it is now an essential tool for the development of advanced bio-medical surfaces and nano-materials. State-of-the-art performance, reduced cost of ownership, increased ease of use and compact size make K-Alpha the ideal solution for many existing as well as new surface analysis application areas. K-Alpha is designed for a multi-user environment and is the first XPS tool to deliver fully automated workflow from sample entry to report generation.
Three Operation Modes for Maximum Flexibility
K-Alpha offers three Operation Modes:
Fully automatic mode to minimize user intervention
Recipe mode for routine analysis
A fully interactive expert mode
K-Alpha carries out both large and small feature analyses. For small feature analysis and XPS mapping, the monochromated X-ray beam may be focused into a small spot providing an ultimate lateral resolution of 30 µm. A high-flux, low-energy ion source is integral to K-Alpha for depth profiling. Low energy sputtering combined with azimuthal rotation produces profiles with excellent depth resolution.
Configuration
Microfocusing Monochromatic XPS for fast, efficient analysis
Accurate chemical state determination
Continuous spot size selection
Minimise sample damage
Easy to align
Spectrum linescans mapping capability
Advanced electron optics maximises precision and throughput
Lens: high efficiency, advanced new design
Energy analyser: high resolution.
Parallel and scanned acquisition
Snapshot acquisition for rapid profiling and chemical state imaging
Rapid analysis
Excellent detectability
Accurate sample navigation for total confidence in the analysis
Confidence in analysis position.
Unique lighting system
Co-axial for reflective surfaces
Diffuse for rough sufaces
Unique viewing system
Platter View for sample to sample navigation
Reflex Optics for feture alignment
Sample height setting
Analysis area annotation
‘Click and go’ sample navigation and alignment
New ion gun provides optimum profiling conditions
Optimum depth resolution
Low energy ion beam
Sample rotation
Rastered ion beam
High current to maximise throughput
Automatic alignment and focusing provides total confidence in your results
New charge compensation system for insulator analysis
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