K-Alpha - Monochromated, high-performance XPS spectrometer

  K-Alpha - Monochromated, high-performance XPS spectrometer



The new surface analysis instrument, Thermo Scientific K-Alpha is a fully integrated, monochromated small-spot X-ray Photoelectron Spectrometer (XPS) system.  

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XPS is already well-established in many branches of materials characterisation and it is now an essential tool for the development of advanced bio-medical surfaces and nano-materials. State-of-the-art performance, reduced cost of ownership, increased ease of use and compact size make K-Alpha the ideal solution for many existing as well as new surface analysis application areas. K-Alpha is designed for a multi-user environment and is the first XPS tool to deliver fully automated workflow from sample entry to report generation.

Three Operation Modes for Maximum Flexibility

    K-Alpha offers three Operation Modes:
  • Fully automatic mode to minimize user intervention
  • Recipe mode for routine analysis
  • A fully interactive expert mode

K-Alpha carries out both large and small feature analyses. For small feature analysis and XPS mapping, the monochromated X-ray beam may be focused into a small spot providing an ultimate lateral resolution of 30 µm. A high-flux, low-energy ion source is integral to K-Alpha for depth profiling. Low energy sputtering combined with azimuthal rotation produces profiles with excellent depth resolution.


Configuration

    Microfocusing Monochromatic XPS for fast, efficient analysis
  • Accurate chemical state determination
  • Continuous spot size selection
  • Minimise sample damage
  • Easy to align
  • Spectrum linescans mapping capability

    Advanced electron optics maximises precision and throughput
  • Lens: high efficiency, advanced new design
  • Energy analyser: high resolution.
  • Parallel and scanned acquisition
  • Snapshot acquisition for rapid profiling and chemical state imaging
  • Rapid analysis
  • Excellent detectability

    Accurate sample navigation for total confidence in the analysis
  • Confidence in analysis position.
  • Unique lighting system
    • Co-axial for reflective surfaces
    • Diffuse for rough sufaces
  • Unique viewing system
    • Platter View for sample to sample navigation
    • Reflex Optics for feture alignment
    • Sample height setting
  • Analysis area annotation
  • ‘Click and go’ sample navigation and alignment

    New ion gun provides optimum profiling conditions
  • Optimum depth resolution
    • Low energy ion beam
    • Sample rotation
    • Rastered ion beam
  • High current to maximise throughput
  • Automatic alignment and focusing provides total confidence in your results

    New charge compensation system for insulator analysis
  • High resolution spectra
  • All sample types
  • Small and large area analysis
  • No user intervention required


 
Purchase Details
SKU : IQLAADGAAFFACVMAHV 
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