Slide-On ATR Microscope Objective

Collecting spectra is as easy as placing the sample upon the stage and bringing it in contact with the crystal. The unique properties of the hemispherical crystals limit the depth of penetration into the sample surface avoiding saturation of the spectral bands. The conical tip design provides exceptional sensitivity and higher depth of penetration. This allows the analyst to make quick work of identifying trace evidence, defects or inclusions, even inside depressions. Crystals for this objective are pre-aligned in slide-on mounts that offer sampling reproducibility not found in "pogo stick" or complicated spring loaded designs.

The durable crystal design and the precise mounting system allow ATR map-surveys on many non-abrasive surfaces. This unique capability allows spectral previewing when moving the sample in contact mode. Users can identify the most significant sample spot or area in seconds.

The Slide-On allows the most convenient cleaning and crystal inspection to avoid cross-contamination without rotating the objective nosepiece or lowering the stage to get access to the crystal. The Slide-On objective provides transmission, reflection and ATR infrared collection modes as a convenient, unique combination. It also provides the best optical image, due to the infinity-corrected design.

The Slide-On ATR Objective provides the following benefits:
• Sample position reproducibility
• Easy cleaning to avoid cross-contamination
• ATR survey mode
• Cost effective, replaceable crystals
• Uncompromised transmission, reflection and ATR in a single objective
• Infinity-corrected optical design
• Proprietary spherical aberration compensation

Applications
• Surface analysis/depth profiling
• Coatings on non-reflecting substrates
• Inclusions in resins, polymers and rubber materials
• Art & historical artifacts
• Microelectronics
• Forensics
• Defect analysis
• Residuals inside depressions

Crystal Offerings:
The patented design allows simple in situ exchange of crystals with different materials available for specific sample types.

Germanium Hemispherical
A hard material with a shallow depth of penetration that is excellent for use with thin layers of carbon-filled materials that cannot be analyzed with other crystal types. Good choice for ATR surveys.

Silicon Hemisperical
A harder material with a deeper depth of penetration than Ge. Excellent for rigid materials and powders that may damage softer crystals. Best choice for ATR surveys.

Tip Crystal
A Ge conical shaped crystal with a large depth of penetration designed to measure samples inside depressions or between obstacles (i.e. assembled electronic boards). Good choice for ATR surveys.

The Slide-On ATR objective comes standard with a sensor plate designed for the integrated contact-alert electronics of the Continuµm^TM and the Contiuµm XL  which not only speeds analysis and assures good sample contact with the crystal, but also allows unattended ATR mapping.