MK.4 ESD and Latch-Up Test
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  MK.4 ESD and Latch-Up Test


The Thermo Scientific MK.4 is our flagship ESD & Latch-Up test system. With the highest speed of test execution, lowest Zap interval, and the ability to perform concurrent Zap and Curve Trace testing, the MK.4 has become the de facto ESD and Latch-Up test system standard for producers of multifunction high pin-count devices.
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The advanced modular matrix hardware of the Thermo Scientific MK.4, which is at least 10 times faster than mechanically driven testers, builds on the legendary performance and reliability of the original, and its successor, the MK.2. In constant use since the late-eighties, MK.4 and MK.2 have been embraced by manufacturers and test houses worldwide, the result being an installed user base numbering well into the hundreds.

A powerful, extraordinarily fast embedded VME controller drives the highest test execution speeds available by eliminating unnecessary data transfer, a real timesaver when evaluating large devices.

The MK.4 can be equipped with up to eight 0V to 100V 4-quadrant Voltage and Current (V/I) power supplies for accurate device parametric measurements.  

Each V/I supply has a wide dynamic range enabling them to force and measure voltages and currents from 100mV/10A to 100V/1A. The system’s power supply matrix can deliver up to a total of 18A of current distributed between the installed number of supplies, ,limited by dissipation factors of the highest consumption supply. This provides a fast and versatile means of making any number of DC parametric and leakage tests, while offering total control and protection of the DUT. (Additional V/I supply configurations are also available.)

In addition, the High Voltage power source chassis with Patent Pending HV isolation enables excellent pulse source performance.  

The MK.4 provides the most advanced device preconditioning capability available. The DUT can be vectored with complex test and vector patterns giving the operator complete control  over the state of the DUT. Each device pin can be driven with vectors up to 256k deep, at clock speeds up to 10MHz. The read back capability on every pin makes device makes verification fast and easy.

The switching matrix, which is designed to provide consistent ESD paths to each pin, also allows any pin to be grounded, floated, vectored or connected to any of the installed V/I supplies.

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SKU : PID-10130378 
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Specifications:
Test devices up to 2304 pins. :Systems available configured for 1152, 1728 or 2304 pins.
Human Body Model: (HBM) per ESDA STM5.1, JEDEC/JESD22-A114, MIL-STD 883E, and AEC Q100-002 specifications, 25V- 8KV in steps of 1V. :Test to multiple industry standards in one integrated system; no changing or alignment of pulse sources.
Machine Model (MM) per ESDA STM5.2, JEDEC/JESD22-A115, and AEC Q100-003, 25V to 2kV in steps of 1V. :Integrated pulse sources allow fast multi-site test execution.
Latch-up testing per JEDEC/JESD 78 and AEC Q100-004. :Includes preconditioning, state read-back and full control of each test pin.
256k vectors per pin with read-back. :Full real-time bandwidth behind each of the matrix pins.
6 independent vector voltage levels. :Test complex I/O and Multi-Core products with ease.
Up to 10MHz vector rate programmable from an internal clock. :Quickly and accurately set the device into the desired state for testing.
Up to eight separate V/I supplies (1 stimulus and 7 bias supplies). :High accuracy DUT power, curve tracing, and Latch-up stimulus. System design also provides high current capability through the V/I matrix.
Power supply sequencing. :Provides additional flexibility to meet more demanding test needs of integrated system-on-chip (SOC) designs.
6 square ft. system footprint. :Efficient use of space with convenient user access.