Celestron Flexible Bench Top TLP/VF-TLP Test System
The Thermo Scientific Celestron is a bench top test system for fast, accurate and reliable characterization of advanced semiconductor structures. The standard features and available options make the Celestron the most flexible tool for the characterization of semiconductor structures available. The system can be configured for TLP, VF-TLP, HBM ESD and MM ESD for testing at the wafer level and/or the package level. Optional probes can also be used to measure current and voltage on pins or pads other than the ones being stressed.
Product Detail
The Thermo Scientific Celestron system software is the most comprehensive in the industry and uses graphics to assist in system setup and connection to the DUT. It displays the recorded TLP pulse voltage and current waveforms, compiled pulsed I-V curve, leakage current measurements and DC I-V curve trace. The operator can select the range of test voltages (stress pulses); pulse polarity, leakage and curve trace parameters. The user can select the position and duration of the measurement window within the TLP pulse and modify these settings after the data is collected.
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