The RM 215 HM X-ray thickness gauge improves production quality by real-time feedback of absolute or deviation-from-target thickness measurements. These measurements can be used for manual, AGC or adaptive control of the mill. Faster mill setup time optimizes mill processes with increased energy savings to the customer and the high speed measurement and statistical data are invaluable for mill control.
Product Detail
The RM 215 HM is built on a flexible electronics platform that provides the user with the ability to upgrade their gauging system reusing their existing sensors, taking advantage of spare parts inventory.
For applications where cross-strip thickness profile measurements are required, the RM 215 HM is available with scanning options that can be further upgraded to a profiling pair arrangement. The RM 215 HM platform sets the standard for accurate, reliable thickness measurement on a flexible electronics platform.
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