The MicroXR GXR/S is ideal for microbeam XRF measurements that require higher sensitivities for RoHS applications and plating thickness measurements.
Product Detail
The MicroXR GXR/S system provides high resolution XRF measurements of Pb, Cd, Hg, total Cr and total Br levels where a small area analysis is required. The MicroXR GXR/S can be used to provide more precise XRF measurements for Pb and Cd, isolating the exact location desired for measurement. The MicroXR GXR/S provides a visual image of the sample which can be used to pinpoint measurement location, as well as provide the detailed image for historical documentation.
MicroXR benchtop platform is a configurable microbeam XRF film thickness and composition measuring tool. This platform includes several X-ray beam and detection options for application flexibility, and provides unparalleled performance in accuracy, precision and reproducibility.
Mechanical or optical X-ray beam collimation options
Proportional counter, PIN diode, SDD or Si(Li) X-ray detector options
Servo driven x-y-z stage with linear encoder option for accurate sample positioning
Measurement method in accordance with ASTM B 568/ISO3497
Application Performance The MicroXR platform employs X-ray fluorescence technology in its electronics and software. Application performance specifications ensure that your microbeam XRF system is designed for your specific application and operational purposes:
Algorithms tools using empirical and fundamental parameters, non-standard and standard-corrected
Alloy analysis up to a total of 30 elements
Thickness and composition on one to five deposition layers and one substrate layer simultaneously, to a total of 30 elements per application
Relative mode calibration for measurement on recessed areas (focus independent)\
Absorption mode
Linear excitation mode
Immersion coating mode
Density and base correction
Electroless Ni thickness and composition analysis (optional)
Measurement Performance The MicroXR platform is designed for unsurpassed accuracy and versatility, including several features to tailor the instrument to specific measurements:
Application and standards library
Automated programmable stage measurement
Automatic beam alignment
Multiplexed graphical and video signal for single screen operation
Point-and-shoot sample positioning
Computer-generated reticle with beam size indicator
Programmable icons with operator interface designer
Two- and three-dimensional mapping software
Full statistics package
Part number management system with optional bar code reader
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