MicroXR GXR Microbeam X-ray Fluorescence System

  MicroXR GXR Microbeam X-ray Fluorescence System



The MicroXR GXR is the entry-level microbeam XRF system for coating thickness and plating thickness measurements. It employs mechanical x-ray beam collimation and a gas propotional counter detector. The MicroXR GXR is fully-upgradable to optically collimated systems with a range of detector options.
   Product Detail


MicroXR benchtop platform is a configurable microbeam XRF film thickness and composition measuring tool. This platform includes several X-ray beam and detection options for application flexibility, and provides unparalleled performance in accuracy, precision and reproducibility.
  • Mechanical or optical X-ray beam collimation options
  • Proportional counter, PIN diode, SDD or Si(Li) X-ray detector options
  • Servo driven x-y-z stage with linear encoder option for accurate sample positioning
  • Measurement method in accordance with ASTM B 568/ISO3497

Application Performance
The MicroXR platform employs X-ray fluorescence technology in its electronics and software. Application performance specifications ensure that your microbeam XRF system is designed for your specific application and operational purposes:

  • Algorithms tools using empirical and fundamental parameters, non-standard and standard-corrected
  • Alloy analysis up to a total of 30 elements
  • Thickness and composition on one to five deposition layers and one substrate layer simultaneously, to a total of 30 elements per application
  • Relative mode calibration for measurement on recessed areas (focus independent)\
  • Absorption mode
  • Linear excitation mode
  • Immersion coating mode
  • Density and base correction
  • Electroless Ni thickness and composition analysis (optional)

Measurement Performance
The MicroXR platform is designed for unsurpassed accuracy and versatility, including several features to tailor the instrument to specific measurements:

  • Application and standards library
  • Automated programmable stage measurement
  • Automatic beam alignment
  • Multiplexed graphical and video signal for single screen operation
  • Point-and-shoot sample positioning
  • Computer-generated reticle with beam size indicator
  • Programmable icons with operator interface designer
  • Two- and three-dimensional mapping software
  • Full statistics package
  • Part number management system with optional bar code reader

 

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Purchase Details
SKU : IQLAADGAAZFADKMAGM 
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  • Our Training Institutes (North America)
  • Literature Request
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  • MicroXR Benchtop Platform Specification Sheet
  • MicroXR Microbeam XRF Brochure
  • Specifications:
    X-ray Tube :Micro-focus with 3- or 5-mil beryllium window (W, Mo CR target)
    Mechanical collimation :
    Round :2, 4, 8, 12 mil
    Rectangular :2 x 8, 3 x 12 mill
    Detector Type :Proportional Counter
    Dimensions/Weight :
    Width :27.5" (70 cm)
    Depth :32.25" (82 cm)
    Height :23" (58.5 cm)
    Weight :200 lb (90 kg)
    Sample Door Opening :18" x 12" (46 cm x 30 cm)
    Chamber Dimensions :28" x 24" 33" (70 cm x 60 cm x 84 cm)