The IbeX Wavelength Dispersive Spectrometer is designed to provide superior performance for application-specific microanalysis.
IbeX uses up to 6 diffractors, each optimized in material, d-spacing, and curvature to analyze a specific element.
Hardward and Electronics
Multielement spectrometer, universal diffractor turret for analysis of up to six primary elements, gas flow proportional counter and electronics, IbeX motor and electronics countrol system.
Software
High resolution identification of overlaps in EDS spectra. Ability to acquire, save and load spectral data, automatic peak search and identification, KLM markers, peak hinting, peak labeling, report printing and preview, manual override of acquisition parameters, quantitative analysis and manual calibration. Windows NT 4.x operating system.
Available as a standalone system or used with X-ray Microanalysis system. Beam Current Meter required for quantitative analysis.