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| Spatial Resolution in WDS Applications on FESEMs |
| Use of a Field Emission Scanning Electron Microscope to analyze submicron-sized defects and particles. |
| Use of a parallel beam spectrometer in a field emission scanning electron microscope yields high spatial and peak resolution x-ray microanalysis for beam sensitive or low concentration samples, and samples with severe peak overlaps. |
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1 Artículos Total 7,000.00 USD 