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  Identification of a Tungsten Particle on a Silicon Wafer
 Traditional EDS Identification Problem Solved with MAXray WD Spectrometer
 

The MAXray has the ability to resolve the silicon K?1 peak from the tungsten M?1 and M?1, providing definitive identification of the elements. Because of the lower resolution of an energy dispersive spectrometer, the silicon and tungsten data form one large peak, and cannot provide definitive visual identification, while the MAXray forms three distinct peaks.

With the resolving ability and high signal-to-noise, the MAXray is far superior for identifying particles that could not be identified and profiled with an energy dispersive spectrometer alone.

Please contact us if you wish to receive this Application Note via mail.

   Products used for this Application
  Product #   Product Name   Image  
 IQLAADGABJFADHMAIZ  MAXray Parallel Beam Spectrometer      Select
 
   Related Technology
  Wavelength Dispersive X-Ray Spectroscopy (WDS/WDX)