| The ability to quickly analyze microscopic samples has brought infrared microscopy to the top of the list of preferred analytical techniques. The implementation of technologies such as dual aperturing, automated sample mapping, and advanced microscopy software has enabled analysts to achieve high spatial resolution, high sensitivity, and experimental automation.
However, all FT-IR microscopes suffer, to varying degrees, a loss of image quality, reduced energy throughput, and reduced sensitivity – all inherent in the use of real-world optical configurations. The recent implementation of infinity-correction within FT-IR microscope designs offer vast improvements over traditional designs by effectively minimizing real-world optical shortcomings.
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