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  Elemental information and Chemical State Distribution obtained by XPS Mapping on the Sigma Probe and Theta Probe
 Elemental information and Chemical State Distribution obtained by XPS Mapping on the Sigma Probe and Theta Probe.Defect in Polymer coated Al
 Elemental information and Chemical State Distribution
Defect in Polymer coated Al

Survey Spectrum
Survey spectrum from defect and outside defect

   Products used for this Application
  Product #   Product Name   Image  
 IQLAADGAAFFAESMALA  Sigma Probe - Surface Analysis Instrument      Select
 IQLAADGAAFFAFKMAMA  Theta 300 - High Performance ARXPS Spectrometer      Select
 IQLAADGAAFFAFLMAMC  Theta Probe - High Performance ARXPS Spectrometer      Select