Welcome Guest from United States
Sign In Change Country
  0 Items
Search:
 Resources
 
 
  Related Products >
  Multiple Thin Layers Analysis by Angular Resolved X-ray Photoelectron Spectroscopy (ARXPS)
 ARXPS may be applied to multi-layered samples to determine the thickness and chemical composition of each layer
 Multiple Thin Layers
Angular Resolved X-ray Photoelectron Spectroscopy (ARXPS) may be applied to multi-layered samples to determine the thickness and chemical composition of each layer

Parallel Detection
Parallel detection of the Si 2p region of a SiO2/Si3N4/Si sample

Layer Thicknesses
Layer thicknesses, determined by Theta Probe, from four oxide/nitride samples
   Products used for this Application
  Product #   Product Name   Image  
 IQLAADGAAFFAFKMAMA  Theta 300 - High Performance ARXPS Spectrometer      Select
 IQLAADGAAFFAFLMAMC  Theta Probe - High Performance ARXPS Spectrometer      Select