| The high sensitivity and excellent wavelength precision of FT-IR suggest that FT-SPR should be a simple method of measuring the peak shifts corresponding to changes in the refractive index of the solution near the metal surface or more importantly, the adsorption of material onto it.
In this note we describe several experiments designed to measure the sensitivity and precision of FT-SPR under different conditions. The ultimate goal is to determine the sensitivity of FT-SPR for small molecule binding studies and other thin film research. |
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