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Many important application areas for Fourier transform near-infrared (FT-NIR) analysis involve the acquisition of diffuse reflectance spectra directly from powdered or solid samples. AntarisTM FT-NIR analyzers offer diffuse reflectance capabilities. The diffuse reflectance module of the this system is based on an optimized internal integrating sphere concept. In this report, we will describe a series of tests performed on the Nicolet Antaris Solid Sampling System to verify key performance features that are important in a number of reflectance applications.
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