Xphase software finds locations within a collection of x-ray maps that form uniquely defined phases. Spectral Imaging for the NORAN System 7 X-ray Microanalysis system enhances the traditional method of collecting elemental maps, which can be extracted from the sample based on simple X-ray counts or using quantitative analysis to correct for peak overlaps. In either case, these maps have the ability to show where like elemental concentration regions exist within the sample.

However, most materials analysts investigate phases, not elements. Locating the phases in a material requires the simultaneous analysis of all elemental maps. Using a collection of element maps for input Xphase accurately identifies phases in your samples. Xphase is particularly useful in cases where the analysis includes a large numbers of elements within each phase, or where the data contains only a few elements within a number of phases.