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The Drift Compensation option for the NORAN System 7 is a feature tracking module that automatically corrects for possible sample drift during an acquisition.
As your sample moves in the microscope, Drift Compensation automatically updates the image location to maintain the integrity of the acquisition. Invaluable for samples requiring a long acquisition time.
Samples in the electron microscope may appear to move on their own. This drifting effect is more common at high magnifications, where small changes have a greater impact on the image.
Drifting can be caused by instability of the microscope stage or electromagnetic lenses, sample heating, or by electronic noise. When sample charging or noise makes the electron beam move erratically, the drift can seem random. In other cases, such as drifting of the stage or electromagnetic lenses, sample movement is more predictable and not as great. |
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