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  X-Ray Microanalysis

Energy and Wavelength Dispersive Spectroscopy

 Energy Dispersive and Wavelength Dispersive X-ray Spectroscopy techniques capture elemental information (characteristic X-rays) during the interaction between the energy beam in an electron microscope and its sample.

X-ray Microanalysis

X-ray microanalysis uses energy dispersive (EDS) and wavelength dispersive spectroscopy (WDS) in the elemental characterization of materials in electron microscopes.

A related technique, Electron Backscattered Diffraction measures diffraction patterns from backscattered electrons for to characterize the crystalline structure (phase identification and crystal orientation) of materials.

  Products used for this Technology

 

 
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EDS X-ray Detectors  Select